Bayesian Process Capability Indices for various Sources of Variability

Bayesian Process Capability Indices for various Sources of Variability

Bayesian Analysis of Process Capability Indices for Single and Multiple Sources of Variability

LAP Lambert Academic Publishing ( 22.10.2010 )

€ 79,00

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The book explains in very simple terms the need and uses of process capability indices and also identifies the shortcomings of existing and classical approaches when analysing manufacturing process data with single and multiple sources of variability. The concept of a capability index is introduced and the basic theory is extended, with an emphasis on the Bayesian approach. The book also investigates various methods of applying capability indices in various kinds of settings. A large number of indices were studied from a Bayesian point of view. The posterior analysis were done using mainly simulation techniques. Vague information was assumed in the prior distributions of the relevant parameters throught. A vague general non-informative prior is used initially for the joint distribution of the mean and variance. Jeffreys' priors as well as the popular and mathematically more challenging reference and probability matching priors were also derived for the mean and variance. The analysis should shed some light on the Bayesian approach in Statiscal Quality Control to both practioners and academics.

Детали книги:

ISBN-13:

978-3-8433-6295-5

ISBN-10:

3843362955

EAN:

9783843362955

Язык книги:

English

By (author) :

Delson Chikobvu
Abrie J van der Merwe

Количество страниц:

284

Опубликовано:

22.10.2010

Категория:

Теория вероятности, стохастичность, математическая статистика