Advanced Physical Metallurgy of Alloys and Thin Films of Semiconductor

Coupling with XRD SEM and TEM, EBSD technique was used for phase identification and studying thermal ageing-, external stress-, electropulsing- and ultra-precision machining - induced phase transformations of alloys. By using previously XRD - and TEM - determined lattice parameters, two hcp phases which had a small difference in lattice parameters (co/ao) of about 1% were distinguished, and circular phase transformations were quantitatively examined. Eleven case studies are presented. Building up a database of lattice parameters of phases involved is one of the key points for EBSD determination of phase transformations in alloys.